Autor: |
T. Hannach, Wolfgang H. Müller, K. Muller, H.-J. Albrecht, A. Juritza, A. Hase |
Rok vydání: |
2005 |
Předmět: |
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Zdroj: |
Proceedings of 6th Electronics Packaging Technology Conference (EPTC 2004) (IEEE Cat. No.04EX971). |
Popis: |
We investigate the mechanical properties of intermetallic phases in microelectronic structures with the help of nanoindentation. Moreover, we shall try to answer the question as to whether nanoindentation can be used to quantify the growth of intermetallic phases, at least at the interface of a solder connection. Different specimens and treatments (such as reflow processes and subsequent aging) have been analyzed. The results of these experiments serve as reference values for FE-simulations which are also discussed. |
Databáze: |
OpenAIRE |
Externí odkaz: |
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