On the Understanding of Defects in Short-Term Negative Bias Temperature Instability (NBTI) for Sub-20-nm DRAM Technology

Autor:	Da Wang, Longda Zhou, Yongkang Xue, Pengpeng Ren, Zixuan Sun, Zirui Wang, Jianping Wang, Blacksmith Wu, Zhigang Ji, Runsheng Wang, Ru Huang
Rok vydání:	2023
Předmět:	Electrical and Electronic Engineering Electronic Optical and Magnetic Materials
Zdroj:	IEEE Electron Device Letters. 44:939-942
ISSN:	1558-0563 0741-3106
DOI:	10.1109/led.2023.3266361
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::748b91d15319fbb46e3856d17f91b216 https://doi.org/10.1109/led.2023.3266361 Zobrazit plný text záznamu