| Autor: |
Naohiro Yamaguchi, Chiemi Fujikawa, Tadayuki Ohchi, Katsumi Watanabe, Masami Taguchi, Tamio Hara, Ibuki Tanaka |
| Rok vydání: |
2001 |
| Předmět: |
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| Zdroj: |
SPIE Proceedings. |
| ISSN: |
0277-786X |
| Popis: |
We have constructed an X-ray photoelectron microscopic system. An X-ray source is a laser-produced plasma in a scheme of an X-ray laser experiment. X rays involving amplified spontaneous emissions (ASE) at 15.47 nm were delivered with a 10-Hz repetition rate from a compact X-ray laser system. X rays were collected and focused by a Schwarzschild optics coated with Mo/Si multilayers for a 15.47-nm X ray. Photoelectron signals due to the Ga 3d and As 3d electrons were observed, when a GaAs wafer was used as a sample. The spatial resolution of about 1 μm was confirmed. |
| Databáze: |
OpenAIRE |
| Externí odkaz: |
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