Abnormal On-Current Degradation Under Non-Conductive Stress in Contact Field Plate Lateral Double-Diffused Metal-Oxide- Semiconductor Transistor With 0.13-μm Bipolar-CMOS-DMOS Technology

Autor:	Wei-Chun Hung, Yu-Fa Tu, Ting-Chang Chang, Mao-Chou Tai, Yung-Fang Tan, Kuan-Hsu Chen, Chien-Hung Yeh, Hong-Yi Tu, Hung-Ming Kuo
Rok vydání:	2022
Předmět:	Electrical and Electronic Engineering Electronic Optical and Magnetic Materials
Zdroj:	IEEE Electron Device Letters. 43:769-772
ISSN:	1558-0563 0741-3106
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::73eb2619fc9c5d5476b4bff7a8cd65bd https://doi.org/10.1109/led.2022.3164475 Zobrazit plný text záznamu