Preferential etchant for revealing crystallographic defects on (111) Te surface of CdTe crystals
Autor: | R. K. Bagai, W.N. Borle, G.L. Seth, Geeta Mohan |
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Rok vydání: | 1987 |
Předmět: | |
Zdroj: | Journal of Crystal Growth. 85:386-388 |
ISSN: | 0022-0248 |
DOI: | 10.1016/0022-0248(87)90467-2 |
Popis: | A new preferential etchant has been developed to delineate etch pits on the (111) Te surface of CdTe crystals. The etch pits formed are well defined conforming to the crystallographic orientation of the surface and reveal dislocations and other crystallographic defects. |
Databáze: | OpenAIRE |
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