Inductor-based ESD protection under CDM-like ESD stress conditions for RF applications
| Autor: | M. Okushima, Piet Wambacq, Guido Groeseneken, P. Jansen, Jonathan Borremans, Dimitri Linten, Steven Thijs, Mirko Scholz |
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| Rok vydání: | 2008 |
| Předmět: |
Engineering
Electrostatic discharge business.industry Electrical engineering Hardware_PERFORMANCEANDRELIABILITY Inductor Electric power transmission Hardware_GENERAL Logic gate Charged-device model Hardware_INTEGRATEDCIRCUITS Electronic engineering Radio frequency business Transmission-line pulse Hardware_LOGICDESIGN Electronic circuit |
| Zdroj: | CICC |
| DOI: | 10.1109/cicc.2008.4672017 |
| Popis: | Charged device model (CDM) electrostatic discharge (ESD) stress is a major concern for inductor-based ESD protection strategies for RF circuits processed in advanced nano-CMOS technologies. The CDM robustness of such protection methodology is investigated in this paper based on very-fast transmission line pulse (VFTLP) measurements. Its applicability is discussed for future technologies and RF applications. |
| Databáze: | OpenAIRE |
| Externí odkaz: |
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