Autor:	P. G. Self, J. Graham, A. R. Milnes, K. Norrish, B. Robinson
Rok vydání:	1990
Předmět:	Diffraction Trace (semiology) Physics Astrophysics Spectroscopy Spectral line
Zdroj:	X-Ray Spectrometry. 19:59-61
ISSN:	1097-4539 0049-8246
DOI:	10.1002/xrs.1300190206
Popis:	Sharp negative lines have been observed in wavelength-dispersive (WD) spectra. These ‘holes’ can cause severe errors when analysing for trace elements near the lower levels of detection. The existence of the holes is explained in terms of diffraction from crystailographic planes other than those used in the WD analysis, and an overview is given of the theory necessary to predict the occurrence of the holes with emphasis on LiF(200) analysing crystals.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::737f87eaa86027b3d728c706ea1afcc6 https://doi.org/10.1002/xrs.1300190206 Zobrazit plný text záznamu Plný text