Quasistatic Dielectric Constants Of Colloidal Nanocrystals

Autor:	I. Humer, J. Smoliner, O. Bethge, C. Eckhardt, M. Bodnarchuk, M. Kovalenko, M. Yarema, W. Heiss, Jisoon Ihm, Hyeonsik Cheong
Rok vydání:	2011
Předmět:	Permittivity Capacitor Materials science Condensed matter physics law Monolayer Electronic engineering Dielectric Scanning capacitance microscopy Spectroscopy Nanocrystalline material Quasistatic process law.invention
Zdroj:	AIP Conference Proceedings.
ISSN:	0094-243X
Popis:	In this paper, the quasistatic dielectric constants of colloidal nanocrystals are investigated by Scanning Capacitance Microscopy/ Spectroscopy (SCM/SCS). Quasistatic C(V) curves are acquired on various nanocrystalline films (Fe3O4,CoFe2O4,PbS) with monolayer thickness and on uncovered reference areas on the same sample. Out of these data, the static dielectric constant is calculated using a simple parallel plate capacitor model. In addition, a systematic increase of the dielectric constants with decreasing frequency is found.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::735f02cd7f176962de45d1c3a411d399 https://doi.org/10.1063/1.3666740 Zobrazit plný text záznamu