| Autor: |
Patrick Cleeve, David Dierickx, Genevieve Buckley, Sergey Gorelick, Lucile Naegele, Lachlan Burne, James C Whisstock, Alex de Marco |
| Rok vydání: |
2022 |
| Popis: |
Automation in microscopy is the key to success in long and complex experiments. Most microscopy manufacturers provide Application Programming Interfaces (API) to enable communication between a user-defined program and the hardware. Although APIs effectively allow the development of complex routines involving hardware control, the developers need to build the applications from basic commands. Here we present a Software Development Kit (SDK) for easy control of Focussed Ion Beam Scanning Electron Microscopes (FIB/SEM) microscopes. The SDK, which we named OpenFIBSEM consists of a suite of building blocks for easy control that simplify the development of complex automated workflows. |
| Databáze: |
OpenAIRE |
| Externí odkaz: |
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