Morphology, structure, and composition of polycrystalline CdTe films grown on three-dimensional silicon substrates
| Autor: | V. V. Kus’nezh, R. Yu. Petrus, G. A. Il’chuk, T. N. Stan’ko, I. V. Kurilo |
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| Rok vydání: | 2013 |
| Předmět: |
Materials science
Silicon Scanning electron microscope General Chemical Engineering Metals and Alloys Analytical chemistry chemistry.chemical_element Cadmium telluride photovoltaics law.invention Inorganic Chemistry Crystallography chemistry Optical microscope law Materials Chemistry Sapphire Atomic ratio Crystallite Tellurium |
| Zdroj: | Inorganic Materials. 49:329-334 |
| ISSN: | 1608-3172 0020-1685 |
| Popis: | Polycrystalline CdTe films have been produced on various substrates (glass, ITO-coated glass, sapphire, and microtextured silicon) by quasi-closed space growth, and their structural perfection and surface morphology have been studied by optical microscopy and scanning electron microscopy. Using an energy dispersive X-ray spectrometer and the scanning electron microscope, we have obtained the X-ray emission spectra of the CdTe films and determined their elemental composition. The morphological features of the films have been investigated and the cadmium-to-tellurium atomic ratio in the films has been determined experimentally. |
| Databáze: | OpenAIRE |
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