Improved Negative Bias Stability of Sol–Gel-Processed SnO2 Thin-Film Transistors with Vertically Controlled Carrier Concentrations

Autor: Taehun Lee, Kyoungdu Kim, Hae-In Kim, Sin-Hyung Lee, Jin-Hyuk Bae, In-Man Kang, Kwangeun Kim, Won-Yong Lee, Jaewon Jang
Rok vydání: 2023
Předmět:
Zdroj: ACS Applied Electronic Materials. 5:2670-2677
ISSN: 2637-6113
Databáze: OpenAIRE