Dislocation crack tip shielding and the Paris exponent

Autor: Johannes Weertman
Rok vydání: 2007
Předmět:
Zdroj: Materials Science and Engineering: A. :59-63
ISSN: 0921-5093
DOI: 10.1016/j.msea.2006.08.128
Popis: In a previous paper we considered how the crack blunting dislocation emission mechanism likely leads to a Paris fatigue crack growth rate law exponent n = 2 if dislocation shielding is not important and showed how dislocation crack tip shielding can cause a reduction in the fatigue crack growth rate and showed qualitatively how it might lead to an increase in the Paris exponent n. In this paper semi-quantitative calculations are made to show how the Paris exponent can be increased by dislocation shielding.
Databáze: OpenAIRE