| Popis: |
The authors report measurements of the electrical resistivity of many high-purity aluminium samples in the thickness range 0.1 mu m to 7 mm over the temperature interval 2 to 300K. It is shown that surface scattering of the conduction electrons affects the temperature dependence of the resistivity for samples less than 0.5 mm in thickness up to 70K. Above about 30K the simple Bloch-Gruneisen theory agrees well with the data obtained using the thickest samples, while, for thinner samples, application of a surface scattering theory due to Soffer (1967) leads to satisfactory agreement between theory and experiment. Fitting of this theory allows the determination of the surface roughness parameter defined as the ratio of the root mean height of surface asperities, a, divided by the electron wavelength at the Fermi surface, lambda e. The authors determine 1 |
