A comparative study of pseudo stuck-at and leakage fault model

Autor:	S. Chakravarty, S.T. Zachariah
Rok vydání:	1999
Předmět:	Stuck-at fault Engineering Simulation algorithm business.industry Fault coverage Electronic engineering Hardware_PERFORMANCEANDRELIABILITY Fault model Leakage (economics) business Algorithm Iddq testing Hardware_LOGICDESIGN
Zdroj:	VLSI Design
Popis:	Pseudo stuck-at is a popular model, used by many commercial tool vendors, for evaluating and selecting I/sub DDQ/ tests. We show that pseudo stuck-at fault coverage numbers are very pessimistic, and equally good vectors can be selected much faster using the leakage fault model. This, and the fact that a fast simulation algorithm exists for leakage faults, prompts us to propose the use of the leakage fault model.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::7237c5e40d3b28893ab8fbfbc56df751 https://doi.org/10.1109/icvd.1999.745130 Zobrazit plný text záznamu