Trace Element Analysis by Secondary Ion Mass Spectrometry with Particular Reference to Silver in the Brunswick Sphalerite

Autor:	L. J. Surges, S. L. Chryssoulis, W. J. Chauvin
Rok vydání:	1986
Předmět:	Microprobe Mineral Chemistry Metals and Alloys Parts-per notation Analytical chemistry Mineralogy engineering.material Industrial and Manufacturing Engineering Characterization (materials science) Ion Secondary ion mass spectrometry Ion implantation Sphalerite engineering
Zdroj:	Canadian Metallurgical Quarterly. 25:233-239
ISSN:	1879-1395 0008-4433
DOI:	10.1179/cmq.1986.25.3.233
Popis:	The ion microprobe, a form of Secondary Ion Mass Spectrometer (SIMS), is one of the most sensitive instruments for the in-situ characterization of elemental distribution in mineral phases of limited dimension. Detection limits of parts per million have been achieved.The use of the ion microprobe for the analysis of minerals has been limited by factors inherent to the instrument and to the technique. The use of closely matching standards is the most widely recognized method for obtaining quantitative measurements. Ion implantation was used to produce closely matching standards for the present study.Trace amounts of silver in major sulphide minerals may significantly contribute to the silver distribution in complex sulphide ores. The ion microprobe opens a new field for the determination of the mineralogical balance of trace elements in processing plants. Various aspects of trace element analysis of sulphide minerals by quantitative SIMS are discussed.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::71f4bc48f4c468c32270f0a61d3d9d15 https://doi.org/10.1179/cmq.1986.25.3.233 Zobrazit plný text záznamu