High resolution syncrotron radiation Si 2p core-level spectroscopy of Si(110)16x2
| Autor: | G. Le Lay, J.P. Lacharme, V.Yu. Aristov, N. Safta, G. Indlekofer, B. Nesterenko, C.A. Sébenne, Amina Taleb-Ibrahimi, A. Cricenti |
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| Rok vydání: | 1995 |
| Předmět: |
Radiation
Materials science Dimer Resolution (electron density) Analytical chemistry Synchrotron radiation Condensed Matter Physics Molecular physics Atomic and Molecular Physics and Optics Spectral line Electronic Optical and Magnetic Materials chemistry.chemical_compound Pedestal chemistry Physical and Theoretical Chemistry Spectroscopy Line (formation) |
| Zdroj: | Journal of Electron Spectroscopy and Related Phenomena. 76:613-617 |
| ISSN: | 0368-2048 |
| DOI: | 10.1016/0368-2048(95)02505-7 |
| Popis: | The clean Si(110)16x2 surface has been studied by high resolution synchrotron radiation core-level spectroscopy. A comparative detailed study of the Si 2p line with an experimental resolution better than 80 meV has been performed. The Si 2p spectra display strong similarities with those from the Si(111)7x7 recontruction pointing to the presence on the 16x2 reconstruction of building blocks (adatoms, rest atoms, pedestal and dimer atoms) similar to the 7x7 one. |
| Databáze: | OpenAIRE |
| Externí odkaz: |
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