| Autor: |
D.R. Lamb, M.P. Singh, P.C.T. Roberts |
| Rok vydání: |
1976 |
| Předmět: |
|
| Zdroj: |
Proceedings of the Institution of Electrical Engineers. 123:389 |
| ISSN: |
0020-3270 |
| DOI: |
10.1049/piee.1976.0088 |
| Popis: |
An analysis of surface-state trapping loss in surface-channel c.c.d.s has been carried out. By calculating the areas under the transfer gates occupied by different sized charge packets it has been shown that the edge effect is the dominant loss mechanism and that it cannot be eliminated by the use of fat-0s. Experimental results which confirm the theoretical predictions are presented. |
| Databáze: |
OpenAIRE |
| Externí odkaz: |
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