Time-domain non-Monte-Carlo method for noise simulation in CMOS imager sensors

Autor: B. J. Mulvaney, M.M. Zharov, Sergey G. Rusakov, S.L. Ulyanov, M.M. Gourary
Rok vydání: 2002
Předmět:
Zdroj: SPIE Proceedings.
ISSN: 0277-786X
DOI: 10.1117/12.463477
Popis: This paper presents an approach for noise characterization of read-out circuits for CMOS image sensors in frames of transient noise analysis. It provides computation of the complete probabilistic characterization of such circuits. The method is efficient because no time-consuming convolution-like procedures are used. The flicker noise is naturally taken into account without additional computational efforts.© (2002) COPYRIGHT SPIE--The International Society for Optical Engineering. Downloading of the abstract is permitted for personal use only.
Databáze: OpenAIRE