Effect of low temperature Ge seed layer and post thermal annealing on quality of Ge1− x Si x (0.05 ≤ x ≤ 0.1) graded buffer layers by UHV-CVD

Autor: Shih Hsuan Tang, Binh Tinh Tran, Nguyen Hong Quan, Chi Lang Nguyen, Guang-Li Luo, Edward Yi Chang, Yung Hsuan Su
Rok vydání: 2014
Předmět:
Zdroj: Electronic Materials Letters. 10:759-762
ISSN: 2093-6788
1738-8090
Popis: High crystal quality, smooth surface and fully relaxed Ge1− x Si x (0.05 ≤ x ≤ 0.1) buffers are grown on 6°-off (100) Si substrate by UHV-CVD. A low-temperature (LT) Ge seed layer is used to improve the quality of the Ge1− x Si x buffers. In this study, the LT-Ge seed layer is deposited directly onto the Si substrate at a low temperature of 315°C. After that, stress-free Si0.1Ge0.9 and Si0.05Ge0.95 layers are grown, respectively. An in-situ annealing process is also performed for the Si0.1Ge0.9/LT-Ge layers to increase the degree of relaxation. The total thickness of the epitaxial layer is 270 nm, with the average surface roughness at 0.6 nm.
Databáze: OpenAIRE
Externí odkaz: