In-Product BTI Aging Sensor for Reliability Screening and Early Detection of Material at Risk

Autor:	Tomasz Brożek, Alberto Piadena, Larg Weiland, Michele Quarantelli, Alberto Coccoli, Sharad Saxena, Christopher Hess, Andrzej Strójwąs
Rok vydání:	2023
Zdroj:	2023 IEEE International Reliability Physics Symposium (IRPS).
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::707e3904f7eba520453c151bb8b8c462 https://doi.org/10.1109/irps48203.2023.10118144 Zobrazit plný text záznamu