A study of laser-deposited PZT, PLZT, PMN and YBCO thin films
| Autor: | E B Kluenkov, Miroslav Jelinek, V. Trtík |
|---|---|
| Rok vydání: | 1994 |
| Předmět: |
Materials science
Laser ablation Acoustics and Ultrasonics Scanning electron microscope Analytical chemistry Mineralogy Substrate (electronics) Coercivity Condensed Matter Physics Epitaxy Ferroelectricity Surfaces Coatings and Films Electronic Optical and Magnetic Materials Electrical measurements Thin film |
| Zdroj: | Journal of Physics D: Applied Physics. 27:1544-1547 |
| ISSN: | 1361-6463 0022-3727 |
| DOI: | 10.1088/0022-3727/27/7/032 |
| Popis: | The preparation of epitaxial thin films of Pb(ZrxTi1-x)O3(0.75, 0.25), Pb(ZrxTi1-x)O3(0.52, 0.48) Pb1-xLax(ZryTiz)1-(x4)/O3(0.09, 0.65, 0.35), PbMg13/Nb23/O3 by means of pulsed laser ablation on YBa2Cu3O7-x coated (100)SrTiO3 and (110)SrTiO3 substrates is reported. The films have been characterized by X-ray diffraction, Rutherford backscattering, scanning electron microscopy and electrical measurements. High-quality ferroelectric films were obtained at substrate temperature of 550, 520 and 550 degrees C for Pb(ZrxTi1-x)O3, Pb1-xLax(ZryTiz)1-(x4)/O3 and PbMg13/Nb23/O3, respectively. X-ray diffraction studies of the Pb(ZrxTi1-x)O3/YBa2Cu3O7-x/(100)SrTiO3 show that the layers grow in the c axis orientation with a rocking angle of 0.4 degrees -0.6 degrees for the YBa2Cu3O7-x and 0.8 degrees -1 degrees for the Pb(ZrxTi1-x)O3 layers. The remanent polarization and coercive field of the Pb(ZrxTi1-x)O3(0.52, 0.48) film were 42 mu C cm-2 and 55 kV cm-1. |
| Databáze: | OpenAIRE |
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