Investigation of inhomogeneities in thin films of high-temperature superconductors by scanning probe microscopy
| Autor: | S. V. Gaponov, E. B. Klyuenkov, A. K. Vorob’ev, N. V. Vostokov, Victor L. Mironov |
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| Rok vydání: | 1999 |
| Předmět: |
Condensed Matter::Materials Science
Scanning probe microscopy Materials science Physics and Astronomy (miscellaneous) Condensed matter physics Condensed Matter::Superconductivity Scanning confocal electron microscopy Atomic force acoustic microscopy Scanning gate microscopy Spin polarized scanning tunneling microscopy Scanning capacitance microscopy Conductive atomic force microscopy Photoconductive atomic force microscopy |
| Zdroj: | Technical Physics Letters. 25:154-156 |
| ISSN: | 1090-6533 1063-7850 |
| DOI: | 10.1134/1.1262384 |
| Popis: | Scanning tunneling microscopy and atomic force microscopy were used to study inhomogeneities in thin films of Y-Ba-Cu-O high-temperature superconductors caused by secondary-phase precipitates. It was established that Y-Ba-Cu-O films with high global critical parameters may constitute a complex heterogeneous system containing regions of different thickness and electrical properties. It is shown that these inhomogeneities may strongly influence the parameters of devices formed using these films. |
| Databáze: | OpenAIRE |
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