Non-recombination injection mode

Autor: R.A. Ayukhanov, R.M. Turmanova, E.S. Esenbaeva, A.Yu. Leyderman, A.K. Uteniyazov
Rok vydání: 2021
Předmět:
Zdroj: Semiconductor Physics, Quantum Electronics and Optoelectronics. 24:248-254
ISSN: 1605-6582
1560-8034
DOI: 10.15407/spqeo24.03.248
Popis: A new type of injection regime is considered – non-recombination one, which can be realized in the forward direction of the current in structures of the p-n-n+ type under conditions of opposite directions of ambipolar diffusion and drift of non-equilibrium carriers. This is possible only if the accumulation at the n-n+ junction is stronger than the injection through the p-n junction, i.e., the concentration of carriers at the boundary of the n-base with the n-n+ junction is higher than their concentration at the boundary of the n-base with the p-n junction. In this mode, the dependences of the current on the voltage of the type J ~ V, and then J ~ V2 appear. Experimentally, such a behavior of the current-voltage characteristic is observed for the Al–Al2O3–CdTe structure.
Databáze: OpenAIRE