Leakage and Matching Optimization of SRAM-cells for Wireless Applications

Autor:	F. Wacquant, Michel Haond, S. Del-Medico, C. Boccaccio, C. Laviron, N. Planes, D. Noblet, J. Bonnouvrier, O. Callen, O. Menut, R. Ranica, Frederic Boeuf
Rok vydání:	2009
Předmět:	Materials science business.industry Electronic engineering Wireless Static random-access memory business Leakage (electronics)
Zdroj:	Extended Abstracts of the 2009 International Conference on Solid State Devices and Materials.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::70383b5c65a45dc63a3caee4a9876c66 https://doi.org/10.7567/ssdm.2009.a-2-7 Zobrazit plný text záznamu