| Autor: |
Eveline Rudigier-Voigt, Jolly Xavier, Philippe Wyss, Franziska Back, Jürgen Probst, Bernd Löchel, Christoph Hülsen, David Eisenhauer, Christiane Becker |
| Rok vydání: |
2014 |
| Předmět: |
|
| Zdroj: |
SPIE Proceedings. |
| ISSN: |
0277-786X |
| DOI: |
10.1117/12.2052796 |
| Popis: |
We present our results on optical absorption enhancement in crystalline silicon (c-Si) absorber structured with transversely quasicrystalline lattice geometry for thin-film photovoltaics. c-Si nanoarchitectures are prepared on the nanoimprinted ten-fold symmetry quasicrystalline textured substrate. The structural features of the fabricated Si nanostructures are analyzed to confirm the defining characteristics of the quasicrystalline texturing of the absorber film. We present the optical absorption plots for a spectrum of incident light for varying angle of light incidence in these fabricated higher symmetry crystalline Si architectures. Neither any back reflector nor antireflection coating is considered in the present study, where use of such layers could further improve the light absorption. The realized quasicrystalline textured silicon nanoarchitectures with higher rotational symmetry lattice geometry are observed to improve the isotropic and broad band absorption properties of the thin film c-Si absorber and envisaged to have efficiency enhanced thin film photovoltaics effective in terms of cost and performance. |
| Databáze: |
OpenAIRE |
| Externí odkaz: |
|
