Autor: |
I. A. Litovsky, M. L. Kulygin, Roman M. Rozental, Evgeny A. Novikov |
Rok vydání: |
2019 |
Předmět: |
|
Zdroj: |
2019 IEEE International Conference on Microwaves, Antennas, Communications and Electronic Systems (COMCAS). |
DOI: |
10.1109/comcas44984.2019.8958380 |
Popis: |
A conception of using laser-driven resonator cavity switches with an active element of semiconductor to measure the semiconductor's loss tangent being unknown is proposed and discussed. A sample calculation for an existent gallium arsenide-based prototype for the frequencies around 300 GHz has demonstrated an unambiguous determination of the loss tangent in the range of at least four orders and two methods. Such a redundancy helps to come over a fabrication imprecision for each prototype and ensure high precision of measurements. |
Databáze: |
OpenAIRE |
Externí odkaz: |
|