| Autor: |
Zain Navabi, Somayeh Sadeghi-Kohan, Mehdi Kamal, Paolo Prinetto, John McNeil |
| Rok vydání: |
2015 |
| Předmět: |
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| Zdroj: |
DTIS |
| DOI: |
10.1109/dtis.2015.7127368 |
| Popis: |
Transistor and interconnect wearout is accelerated with transistor scaling that results in timing variations. Progressive age measurement of a circuit can help a better prevention mechanism for reducing more aging. This requires age monitors that collect progressive age information of the circuit. This paper focuses on monitor structures for implementation of progressive age detection. The monitors are self-adjusting that they adjust themselves to detect progressive changes in the timing of a circuit. Furthermore, the monitors are designed for low hardware overhead, and certainty in reported timing changes. |
| Databáze: |
OpenAIRE |
| Externí odkaz: |
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