Efficient Selection of Trace and Scan Signals for Post-Silicon Debug
| Autor: | Sudhi Proch, Prabhat Mishra, Kamran Rahmani |
|---|---|
| Rok vydání: | 2016 |
| Předmět: |
010302 applied physics
Engineering Boundary scan business.industry Real-time computing Scan chain 02 engineering and technology Integrated circuit design 01 natural sciences 020202 computer hardware & architecture Hardware and Architecture Logic gate 0103 physical sciences 0202 electrical engineering electronic engineering information engineering Overhead (computing) Algorithm design Observability Electrical and Electronic Engineering business Software TRACE (psycholinguistics) |
| Zdroj: | IEEE Transactions on Very Large Scale Integration (VLSI) Systems. 24:313-323 |
| ISSN: | 1557-9999 1063-8210 |
| DOI: | 10.1109/tvlsi.2015.2396083 |
| Popis: | Post-silicon validation is a critical part of integrated circuit design methodology. The primary objective is to detect and eliminate the bugs that have escaped pre-silicon validation phase. One of the key challenges in post-silicon validation is the limited observability of internal signals in manufactured chips. A promising direction to improve observability is to combine trace and scan signals—a small set of trace signals are stored in every cycle, whereas a large set of scan signals are dumped across multiple cycles. Existing techniques are not very effective, since they explore a coarse-grained combination of trace and scan signals. In this paper, we propose a fine-grained architecture that addresses this issue using various scan chains with different dumping periods. We also propose efficient algorithms to select beneficial signals based on this architecture. Our experimental results demonstrate that our approach can improve restoration ratio up to 127% (36% on average) compared with existing trace-only techniques. Our approach also shows up to 125% improvement (61.7% on average) compared with techniques that allow a combination of trace and scan signals with minor ( |
| Databáze: | OpenAIRE |
| Externí odkaz: |
|