Autor: |
Jung Wook Lim, Jong-Su Noh, Hyun-Tak Kim, Sun Jin Yun, Byung-Gyu Chae |
Rok vydání: |
2008 |
Předmět: |
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Zdroj: |
Electrochemical and Solid-State Letters. 11:H173 |
ISSN: |
1099-0062 |
Popis: |
V 2 O 3 films fabricated on (1010) or (1012) Al 2 O 3 substrates in a sol-gel process and subsequent annealing in a very low pressure exhibited an abrupt and large metal-insulator transition (MIT) near -104°C on heating. In this study, VO 2 films initially formed by a sol-gel process were effectively reduced to V 2 O 3 at an annealing temperature of ≥550°C in a vacuum without reducing gases. The V 2 O 3 films exhibited resistance changes as large as 2 X 10 4 -2 X 10 5 due to MIT with annealing temperatures ranging from 550 to 650°C, which are much lower than the process temperature reported in earlier studies. |
Databáze: |
OpenAIRE |
Externí odkaz: |
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