Effect of trapped ions in a gated time‐of‐flight apparatus

Autor:	O. J. Orient, K. E. Martus, Ara Chutjian
Rok vydání:	1993
Předmět:	Particle acceleration Time of flight Spectrum analyzer Materials science Physics::Plasma Physics Pulse generator Mass spectrum Trapping Atomic physics Instrumentation Ion trapping Ion
Zdroj:	Review of Scientific Instruments. 64:1754-1757
ISSN:	1089-7623 0034-6748
Popis:	A three‐mesh gate is used in a time‐of‐flight (TOF) apparatus to analyze the velocity of positive ions. Test results and a theoretical description are presented of an effect arising from trapping ions between meshes of a two‐gate TOF velocity analyzer. The entrapped ions produce a side peak in the TOF spectra corresponding to faster ions. The onset and relative height of the side peak is dependent on the gating voltage and risetime of the pulsing electronics, while the relative intensity depends upon the velocity being sampled and the ratio of the gate width to duration.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::6f855a6256f3ee89a755e3aac82b27b3 https://doi.org/10.1063/1.1144005 Zobrazit plný text záznamu