| Autor: |
Zu Li Liu, Zuo Bin Yuan, Jian Ping Yang, An You Zuo, Xing Ao Li, Kai Lun Yao |
| Rok vydání: |
2008 |
| Předmět: |
|
| Zdroj: |
Key Engineering Materials. :109-111 |
| ISSN: |
1662-9795 |
| DOI: |
10.4028/www.scientific.net/kem.368-372.109 |
| Popis: |
Bi4-xLaxTi3O12 (BLT) ferroelectric thin films were deposited on Pt/Si substrates by RF magnetron sputtering with Bi4-xLaxTi3O12 (x=0.5, 0.75, 1) targets with 50-mm diameter and 5-mm thickness. The effects of La contents on microstructure and ferroelectric properties of Bi4-xLaxTi3O12 thin films were investigated. The grain growth behavior and ferroelectric properties such as remanent polarization were found to be dependent on the La contents in the BLT thin films. |
| Databáze: |
OpenAIRE |
| Externí odkaz: |
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