Validity of the effective potential approach for the simulation of quantum confinement effects: A Monte-Carlo study

Autor: F. De Crecy, Philippe Dollfus, M-A. Jaud, Herve Jaouen, Sylvain Barraud, G. Le Carval
Rok vydání: 2006
Předmět:
Zdroj: Journal of Computational Electronics. 5:171-175
ISSN: 1572-8137
1569-8025
DOI: 10.1007/s10825-006-8839-9
Popis: In the last years, different techniques have been proposed to include quantization effects in simulation of electron transport in nanoscale devices. The Effective Potential approach has been demonstrated as a possible correction method for describing these effects in Monte-Carlo device simulation. In this paper we discuss the numerical implementation and the actual ability of this approach to incorporating electrostatic quantum effects in the frame of an existing Monte-Carlo code (MONACO). A new methodology based on a Design-Of-Experiment is proposed for reproducing the Schrodinger-Poisson electron density profile. This original methodology allows to clearly highlight the validity limits of the Effective Potential correction for the description of quantization effects in a double-gate nMOSFET.
Databáze: OpenAIRE