Improved Kelvin probe force microscopy for imaging individual DNA molecules on insulating surfaces
| Autor: | Carl Leung, Bart W. Hoogenboom, Patrick Mesquida, D. Maradan, Armin Kramer, Stefan Howorka |
|---|---|
| Rok vydání: | 2010 |
| Předmět: |
Kelvin probe force microscope
chemistry.chemical_classification Quantitative Biology::Biomolecules Cantilever Physics and Astronomy (miscellaneous) Silicon business.industry Chemistry Overtone Biomolecule chemistry.chemical_element Nanotechnology Electrostatics Microscopy Optoelectronics Mica business |
| Zdroj: | Applied Physics Letters. 97:203703 |
| ISSN: | 1077-3118 0003-6951 |
| DOI: | 10.1063/1.3512867 |
| Popis: | Electrostatic forces and potentials are keys in determining the interactions between biomolecules. We have recently imaged the topography and electrostatic surface potential of nucleic acid molecules on silicon surfaces using Kelvin probe force microscopy (KPFM). Here, we demonstrate KPFM imaging on insulating surfaces like mica, which provides access to configurations of DNA that are projections of its structure in solution. In particular, we apply dual-frequency mode to minimize the tip-sample distance at which the Kelvin probe signal is acquired and use the fundamental resonance of the cantilever to determine surface potential and its first overtone to detect the topography. |
| Databáze: | OpenAIRE |
| Externí odkaz: |
|