Characterization of the reflectivity of various black and white materials

Autor:	Doyeon Kim, Darren L. DePoy, Mason Perkey, Lauren N. Aldoroty, Jennifer L. Marshall, Leonardo Bush, Yasin Alam, Luke M. Schmidt, Matthew A. Holden
Rok vydání:	2020
Předmět:	Materials science Wavelength range business.industry Stray light Instrumentation Optical instrumentation medicine.disease_cause Reflectivity Characterization (materials science) Optics medicine Scattered light business Ultraviolet
Zdroj:	Advances in Optical and Mechanical Technologies for Telescopes and Instrumentation IV.
DOI:	10.1117/12.2562759
Popis:	We report on an expanded catalog of total reflectance measurements of various common (and uncommon) materials used in the construction and/or baffling of optical systems. Total reflectance is measured over a broad wavelength range (250 nm < λ
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::6ec047095ab14e833ef72f2ed75980d1 https://doi.org/10.1117/12.2562759 Zobrazit plný text záznamu