Electron Emission from Aluminum after Low‐Temperature Deformation

Autor:	F. R. Brotzen, R. N. Claytor
Rok vydání:	1965
Předmět:	Materials science chemistry Condensed matter physics Electrical resistivity and conductivity Annealing (metallurgy) Aluminium General Physics and Astronomy chemistry.chemical_element Activation energy Electron Atmospheric temperature range Atomic physics Crystallographic defect
Zdroj:	Journal of Applied Physics. 36:3549-3555
ISSN:	1089-7550 0021-8979
DOI:	10.1063/1.1703038
Popis:	Emission of electrons (``exo‐electrons'') was observed by means of an open‐window Geiger—Muller counter during annealing of aluminum wire subsequent to low‐temperature deformation. A mathematical model was developed based on the concept that the emission is controlled by the diffusion of point defects to the surface. Interpretation of the experimental data yielded an activation energy of 0.44±0.03 eV for the migration of the point defects. Electrical resistivity measurements made at 4.2°K on aluminum deformed at a low temperature revealed that defects anneal out in the general temperature range in which emission is observed.
Databáze:	OpenAIRE
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