| Autor: |
Sumio Ashida, Katsutaro Ichihara, Tsukasa Nakai, Tetsuya Baba, Naoyuki Taketoshi, Shinichi Tatsuta, Keiichiro Yusu, Kenji Todori |
| Rok vydání: |
2004 |
| Předmět: |
|
| Zdroj: |
SPIE Proceedings. |
| ISSN: |
0277-786X |
| DOI: |
10.1117/12.567626 |
| Popis: |
Thermal conductivities and boundary thermal resistances of thin films having the thickness of the order of ten nanometers were measured by using the thermo-reflectance method at room temperature. A thermal simulation of HD DVD-ARW (the next-generation advanced rewritable DVD) media was carried out to clarify the effect of boundary thermal resistance at the interface of those films. The thermal conductivity of thin films greatly depends on film thickness. The result of the thermal simulation depends significantly on whether the boundary thermal resistance is considered or not. Thus it is important to consider the boundary thermal resistances and using thermal properties of thin films to perform more accurate calculation for the phase change recording media. The results of the thermal simulation also suggested that the boundary thermal resistances dominate the thermal diffusion and response of the medium. |
| Databáze: |
OpenAIRE |
| Externí odkaz: |
|
