In situ analysis of organic monolayers and their reactivity on single micrometer-sized particles by time-of-flight secondary ion mass spectrometry

Autor:	Thomas F. Fister, Richard W. Linton, Robert W. Odom, Kristie L. Willett, Gregory S. Strossman
Rok vydání:	1995
Předmět:	Secondary ion mass spectrometry Anthracene chemistry.chemical_compound Time of flight chemistry Mass spectrum Analytical chemistry Pyrene Particle Reactivity (chemistry) Spectroscopy Ion
Zdroj:	International Journal of Mass Spectrometry and Ion Processes. 143:87-111
ISSN:	0168-1176
DOI:	10.1016/0168-1176(95)04117-4
Popis:	Time-of-flight secondary ion mass spectrometry (TOF-SIMS) was used to study submonolayers of organic compounds of environmental significance adsorbed on coal flyash particles. Through the use of mass-resolved secondary ion images and mass spectra, chemical information on single particles was obtained. For example, TOF-SIMS was capable of distinguishing particles which had higher levels of adsorbed polycyclic organic matter (POM). For flyash particles coated with submonolayer coverages of benzo[e]pyrene, the carbonaceous fraction of these particles had much higher coverages of the adsorbate than did particles from the mineral fraction. TOF-SIMS was also used to monitor reactions such as the photooxidation of benz[a]anthracene on individual particle surfaces. Benz[a]anthracene-7, 12-dione was formed during the initial 15 min of photolysis and gradually decayed with increased photolysis time.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::6e375a167a1edbf44d4eff6fa828d0de https://doi.org/10.1016/0168-1176(95)04117-4 Zobrazit plný text záznamu Full Text from ScienceDirect