The Spotlight: A General Method for Discovering Systematic Errors in Deep Learning Models

Autor: Greg d'Eon, Jason d'Eon, James R. Wright, Kevin Leyton-Brown
Rok vydání: 2022
Zdroj: 2022 ACM Conference on Fairness, Accountability, and Transparency.
DOI: 10.1145/3531146.3533240
Databáze: OpenAIRE
načítá se...