Using statistical inverse methods for detecting defects in electronic components
| Autor: | Valentin Bissuel, Quentin Dupuis, Najib Laraqi, Jean-Gabriel Bauzin |
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| Rok vydání: | 2021 |
| Předmět: | |
| Zdroj: | Journal of Physics: Conference Series. 2116:012078 |
| ISSN: | 1742-6596 1742-6588 |
| DOI: | 10.1088/1742-6596/2116/1/012078 |
| Popis: | The thermal modeling of electronic components is mandatory to optimize the cooling design versus reliability. Indeed most of failures are due to thermal phenomena [1]. Some of them are neglected or omitted by lack of data: ageing, manufacturing issues like voids in glue or solder joints, or material properties variability. Transient measurements of the junction-to-board temperature supply real thermal behavior of the component and PCB assembly to complete these missing data[2]. To complement and supplement the numerical model, inverse methods identification based on a statistical deconvolution approach, such as Bayesian one, is applied on these measurements to extract a Foster RC thermal network. The identification algorithm performances have been demonstrated on numerical as well as experimental dataset. Furthermore defects or voids can be detected using the extracted Foster RC networks. |
| Databáze: | OpenAIRE |
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