Characterization of Biaxial Anisotropic Material Using a Reduced Aperture Waveguide

Autor:	Michael J. Havrilla, Balasubramaniam Shanker, O. Tuncer, Leo C. Kempel, Junyan Tang, Edward J. Rothwell, Benjamin Crowgey
Rok vydání:	2013
Předmět:	Materials science business.industry Modal analysis Single sample Dielectric law.invention Electromagnetic wave transmission Optics Dielectric measurement law Tensor Electrical and Electronic Engineering Anisotropy business Instrumentation Waveguide
Zdroj:	IEEE Transactions on Instrumentation and Measurement. 62:2739-2750
ISSN:	1557-9662 0018-9456
Popis:	A technique is introduced for measuring the electromagnetic properties of a biaxial anisotropic material sample using a reduced-aperture waveguide sample holder designed to accommodate a cubical sample. All the tensor material parameters can be determined by measuring the reflection and transmission coefficients of a single sample placed into several orientations. The theoretical reflection and transmission coefficients necessary to perform the material parameter extraction are obtained using a modal analysis technique. An optimization method that seeks to minimize the difference between theoretically computed and measured reflection and transmission coefficients is used to perform the extraction. Measurements of a stacked dielectric medium is characterized to demonstrate feasibility of the reduced-aperture waveguide approach.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::6db026348da1a6fef3aa0d669d8f5f5e https://doi.org/10.1109/tim.2013.2259752 Zobrazit plný text záznamu