Mirror electron microscopy investigations of thin polyethylene films subjected to high voltage
| Autor: | M Tirnovan, J Heydenreich, R Godehardt, N Popescu-Pogrion |
|---|---|
| Rok vydání: | 1998 |
| Předmět: |
Materials science
business.industry Metals and Alloys High voltage Surfaces and Interfaces Dielectric Electrical treeing Polyethylene Thermal conduction Surfaces Coatings and Films Electronic Optical and Magnetic Materials chemistry.chemical_compound Optics chemistry Materials Chemistry Cathode ray Deposition (phase transition) Composite material Thin film business |
| Zdroj: | Thin Solid Films. 317:235-236 |
| ISSN: | 0040-6090 |
| DOI: | 10.1016/s0040-6090(97)00522-1 |
| Popis: | The practical importance of these studies comes from the fact that, the local degradation of dielectric layers due to the treeing discharge leads to the increment of energy losses and finally to the electric breakdown of the films. The thickness of the deposition layers was 1000 A. For the application of high voltage, we used the needle-plane system. The Mirror Electron Microscopy (MEM) investigations in polyethylene films without the application of high voltage have shown electrical inhomogeneities. After the application of high voltage (4 to 12 kV), thin polyethylene films have no electrical inhomogeneities because the sites corresponding to local conduction filaments are the starting points for pre-breakdown phenomenon. |
| Databáze: | OpenAIRE |
| Externí odkaz: |
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