| Autor: |
V. Yu. Slobodchikov, I. D. Velt, R. V. Kalashnikov, A.N. Matlashov, Yu E. Zhuravlev, Alexander Bakharev, S. L. Nikulin |
| Rok vydání: |
1992 |
| Předmět: |
|
| Zdroj: |
Superconducting Devices and Their Applications ISBN: 9783642774591 |
| DOI: |
10.1007/978-3-642-77457-7_102 |
| Popis: |
We have studied the possibility to utilize second order dc-SQUID gradiometers to localize interlayer point defects of multilayer electronic cards. First a source model in the form of flat arbitrarily shaped current loop was tested. After that we have measured the magnetic field from the card. We used a regulization reconstruction technique to obtain the current density pattern. A defect localization accuracy of about 2 mm was obtained. |
| Databáze: |
OpenAIRE |
| Externí odkaz: |
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