Enhanced charge transfer in doped nano-systems measured via electron-ion coincidence technique

Autor:	D Rolled, E. C. Red, René C. Bilodeau, A Aguilart, Z Pešić, Nora Berrah, M. Hoener
Rok vydání:	2009
Předmět:	History Chemistry Doping Electron Computer Science Applications Education Ion Interatomic Coulombic decay Electron transfer Ionization Nano Physics::Atomic and Molecular Clusters Cluster (physics) Atomic physics
Zdroj:	Journal of Physics: Conference Series. 194:022104
ISSN:	1742-6596
DOI:	10.1088/1742-6596/194/2/022104
Popis:	Interatomic energy and charge transfer in a Xe doped Ar cluster have been investigated. Besides interatomic Coulombic decay (ICD), electron transfer mediated decay (ETMD) seems to play a significant role in the relaxation process of heterogeneous systems which is in strong contrast to pristine clusters. Ar 2p electrons have been measured in coincidences with cluster fragments. The high resolution in time and energy of the detectors enabled us to determine the site of ionization on the cluster and the kind of the resulting fragments.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::6ce4f55a7903112d5728aefd5d026287 https://doi.org/10.1088/1742-6596/194/2/022104 Zobrazit plný text záznamu