High-finesse resonant-cavity photodetectors with an adjustable resonance frequency
| Autor: | Russell D. Dupuis, E.L. Hu, J.E. Bowers, M.R. Islam, B. G. Streetman, I.-H. Tan, Joe C. Campbell, S.S. Murtaza, K.A. Anselm, R.V. Chelakara |
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| Rok vydání: | 1996 |
| Předmět: |
Materials science
business.industry Physics::Optics Photodetector Distributed Bragg reflector Atomic and Molecular Physics and Optics Gallium arsenide Wavelength Finesse chemistry.chemical_compound Laser linewidth Optics chemistry Etching (microfabrication) Optoelectronics Quantum efficiency business |
| Zdroj: | Journal of Lightwave Technology. 14:1081-1089 |
| ISSN: | 0733-8724 |
| DOI: | 10.1109/50.511609 |
| Popis: | High speeds, high external quantum efficiencies, narrow spectral linewidths, and convenience in coupling make resonant-cavity photodetectors (RECAP's) good candidates for telecommunication applications. In this paper, we present analytical expressions for the design of RECAP's with narrow spectral linewidths and high quantum efficiencies. We also present experimental results on a RECAP having an operating wavelength /spl lambda//sub 0//spl ap/1.3 /spl mu/m with a very narrow spectral response. The absorption takes place in a thin In/sub 0.53/Ga/sub 0.47/As layer placed in an InP cavity. The InP p-i-n structure was wafer bonded to a high-reflectivity GaAs/AlAs quarter-wavelength Bragg reflector. The top mirror consisted of three pairs of a ZnSe/CaF/sub 2/ quarter-wavelength stack (QWS). A spectral linewidth of 1.8 nm was obtained with an external quantum efficiency of 48%. We also demonstrate that the spectral response can be tailored by etching the top layer of the microcavity. The results are found to agree well with those obtained from analytical expressions derived on the assumption of linear-phase Bragg reflectors as well as detailed simulations performed using the transfer matrix method. |
| Databáze: | OpenAIRE |
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