Visualization and classification of epitaxial alignment at hetero-phase boundaries
| Autor: | B. De Schutter, Christophe Detavernier, K. De Keyser |
|---|---|
| Rok vydání: | 2016 |
| Předmět: |
010302 applied physics
Materials science Condensed matter physics Metals and Alloys 02 engineering and technology Surfaces and Interfaces 021001 nanoscience & nanotechnology Epitaxy 01 natural sciences Surfaces Coatings and Films Electronic Optical and Magnetic Materials Visualization Tetragonal crystal system chemistry.chemical_compound Crystallography chemistry Robustness (computer science) Lattice (order) 0103 physical sciences Silicide Materials Chemistry Orthorhombic crystal system Thin film 0210 nano-technology |
| Zdroj: | Thin Solid Films. 599:104-112 |
| ISSN: | 0040-6090 |
| DOI: | 10.1016/j.tsf.2015.12.051 |
| Popis: | We use the concept of a Map of Interfacial Periodicity to visualize and classify the periodicity at hetero-phase boundaries. Periodicity in the plane of the interface is a necessary condition to achieve an optimized bonding arrangement across the interface. A periodic boundary plane may be achieved by plane matching, i.e., a 2D match of crystal planes within the plane of the interface, or plane alignment, i.e., matching of lattice planes that are aligned across the interface. The latter mechanism results in axiotaxy and aligned epitaxy and improves robustness for the ‘matching’ nature of the interface with respect to perturbations in grain orientation or interfacial roughness. Examples are presented for different types of epitaxial interfaces between tetragonal α -FeSi 2 or orthorhombic NiSi and Si(001), two systems that are known to exhibit both axiotaxial and epitaxial texture components. |
| Databáze: | OpenAIRE |
| Externí odkaz: |
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