Assessment of the Characteristics of a MV Planar Image Acquired Using a Commercial TFT kV Imaging Detector

Autor:	Hyunsoo Jang, Kyoung Won Jang, Manwoo Lee, Jonggeun Baek, Eng Chan Kim, Young Kee Oh, Wooseok Kim, Dong Hyeok Jeong, Sang Koo Kang
Rok vydání:	2020
Předmět:	Optics Materials science Planar business.industry Thin-film transistor Image quality Detector General Physics and Astronomy business Image (mathematics)
Zdroj:	New Physics: Sae Mulli. 70:327-334
ISSN:	2289-0041 0374-4914
DOI:	10.3938/npsm.70.327
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::6c7dc653d04ecb4c50093b5f664870d9 https://doi.org/10.3938/npsm.70.327 Zobrazit plný text záznamu