Bulk Crystal Growth, and High-Resolution X-ray Diffraction Results of LiZnAs Semiconductor Material
Autor: | Luke C. Henson, Douglas S. McGregor, Kyle A. Nelson, Madhana Sunder, Philip B. Ugorowski, Michael A. Reichenberger, Benjamin W. Montag |
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Rok vydání: | 2017 |
Předmět: |
010302 applied physics
Materials science chemistry.chemical_element Germanium 02 engineering and technology Crystal structure 021001 nanoscience & nanotechnology Condensed Matter Physics 01 natural sciences Electronic Optical and Magnetic Materials Crystallography Full width at half maximum Lattice constant chemistry 0103 physical sciences X-ray crystallography Materials Chemistry Electrical and Electronic Engineering Ingot 0210 nano-technology Single crystal Diffractometer |
Zdroj: | Journal of Electronic Materials. 46:4875-4882 |
ISSN: | 1543-186X 0361-5235 |
DOI: | 10.1007/s11664-017-5471-3 |
Popis: | LiZnAs is being explored as a candidate for solid-state neutron detectors. The compact form, solid-state device would have greater efficiency than present day gas-filled 3He and 10BF3 detectors. Devices fabricated from LiZnAs having either natural Li (nominally 7.5% 6Li) or enriched 6Li (usually 95% 6Li) as constituent atoms may provide a material for compact high efficiency neutron detectors. The 6Li(n,t)4He reaction yields a total Q-value of 4.78 MeV, an energy larger than that of the 10B reaction, which can easily be identified above background radiations. LiZnAs material was synthesized by preparing equimolar portions of Li, Zn, and As sealed under vacuum (10−6 Torr) in quartz ampoules lined with boron nitride and subsequently reacted in a compounding furnace (Montag et al. in J Cryst Growth 412:103, 2015). The raw synthesized LiZnAs was purified by a static vacuum sublimation in quartz (Montag et al. in J Cryst Growth 438:99, 2016). Bulk crystalline LiZnAs ingots were grown from the purified material with a high-temperature Bridgman-style growth process described here. One of the largest LiZnAs ingots harvested was 9.6 mm in diameter and 4.2 mm in length. Samples were harvested from the ingot and were characterized for crystallinity using a Bruker AXS Inc. D8 AXS Inc. D2 CRYSO, energy dispersive x-ray diffractometer, and a Bruker AXS Inc. D8 DISCOVER, high-resolution x-ray diffractometer equipped with molybdenum radiation, Gobel mirror, four bounce germanium monochromator and a scintillation detector. The primary beam divergence was determined to be 0.004°, using a single crystal Si standard. The x-ray based characterization revealed that the samples nucleated in the (110) direction and a high-resolution open detector rocking curve recorded on the (220) LiZnAs yielded a full width at half maximum (FWHM) of 0.235°. Sectional pole figures using off-axis reflections of the (211) LiZnAs confirmed in-plane ordering, and also indicated the presence of multiple domains. The LiZnAs bulk crystals exhibited a Primitive Cubic Bravais lattice instead of the commonly reported Face-centered Cubic Bravais lattice. The lattice constant was determined to be 5.5146 ± 0.0003 A. |
Databáze: | OpenAIRE |
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