Two-dimensional Fourier domain Ronchi ruling measurement using Talbot-based crossing point modeling
| Autor: | Dae Wook Kim, Sukmock Lee |
|---|---|
| Rok vydání: | 2020 |
| Předmět: |
Accuracy and precision
business.product_category Pixel business.industry Computer science General Engineering 02 engineering and technology 01 natural sciences Atomic and Molecular Physics and Optics Metrology 010309 optics symbols.namesake 020210 optoelectronics & photonics Optics Fourier transform Fourier analysis 0103 physical sciences 0202 electrical engineering electronic engineering information engineering symbols Talbot effect Spatial frequency business Digital camera |
| Zdroj: | Optical Engineering. 59:1 |
| ISSN: | 0091-3286 |
| DOI: | 10.1117/1.oe.59.1.014106 |
| Popis: | We propose a direct two-dimensional Fourier domain fitting-free method to determine the period of a Ronchi ruling. A precise method to measure a spatial frequency target’s quality and fidelity is highly desired as the pattern period directly affects every aspect of a spatial frequency target-based metrology, including the accuracy and precision of the measurement or evaluations. A standard Talbot experimental apparatus and the Talbot effect are used to obtain and model our data. To determine the period of the ruling directly, only a common digital camera, with a protective glass and an air gap in front of the sensor array, and a Ronchi ruling of chrome deposited on a glass substrate are required. The Talbot effect-based crossing point modeling technique requires no calibration or a priori information but simply the pixel size of the digital camera and a precise means of measuring the spatial frequency from a Talbot image. For a Ronchi ruling with a period specification of 0.1 mm, the nanometric measurement was found to be 0.100010 mm with an error level of 5 nm. |
| Databáze: | OpenAIRE |
| Externí odkaz: |
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