Research on loss and thermal reliability for Neutral Point Clamped Three-level SVG

Autor:	Shule Hou, Quan Chen, Jun Tao, Baoshun Yang, Quanjing Zhu
Rok vydání:	2022
Zdroj:	2022 IEEE 5th International Electrical and Energy Conference (CIEEC).
DOI:	10.1109/cieec54735.2022.9845828
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::6c22c9ca7066aa4df44f9c74df3dc5db https://doi.org/10.1109/cieec54735.2022.9845828 Zobrazit plný text záznamu