Built-out self-test (BOST) for analog circuits in a system LSI test solution to reduce test costs

Autor: S. Yamada, H. Hanai, T. Funakura, E. Yamashita, H. Mori
Rok vydání: 2002
Předmět:
Zdroj: Asian Test Symposium
DOI: 10.1109/ats.2001.990330
Popis: BOST (built out self test), puts the high performance test unit on the performance-board and achieves high performance measurement. We focused on D/A and A/D converter testing and developed a BOST which is placed on the performance board and measures and analyzes the electrical D/A and A/D characteristics, statically, such as nonlinearity error, with high resolution and high accuracy in short periods by using a conventional logic tester in the factory. This report describes the outline of BOST and the effect for improvement of test accuracy, and reduction of test time.
Databáze: OpenAIRE